Temirgaliyev Zholdasbek E. (web-developer, KIMEP University, Almaty, Kazakhstan)
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The article deals with the methods of computer science and data science in the field of electron microscopy of materials. Attention is paid to the problems of noise, image distortion, spectral mixing. The ways of solving the drift problem are shown. The conclusion is made about the expediency of combining several methods.
Keywords:microscopy of materials; Poisson noise; Gaussian noise; Gaussian distributions; principal component analysis; distortion correction
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Citation link: Temirgaliyev Z. E. Methods of computer science in microscopy of materials // Современная наука: актуальные проблемы теории и практики. Серия: Естественные и Технические Науки. -2018. -№11. -С. 98-101 |
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